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ADE7757–Typical Performance Characteristics
V DD
100nF
10 F
220V
602k
200
150nF
V2P
V DD
U1
F1
F2
U3
K7
ADE7757
CF
40A TO
40mA
200
150nF
V2N
PS2501-1
K8
REVP
350
200
150nF
V1P
RCLKIN
6.2k
V DD
200
150nF
V1N
S0
10k
1 F
100nF
REF IN/OUT
AGND DGND
S1
SCF
10nF
10nF
10nF
Figure 2. Test Circuit for Performance Curves
0.5
0.4
0.3
PF = 1
ON-CHIP REFERENCE
1.0
PF = 1
0.8 EXTERNAL REFERENCE
0.6
+85 C
0.2
+25 C
+85 C
0.4
+25 C
0.1
0
–0.1
0.2
0
–0.2
–0.2
–40 C
–0.4
–0.3
–0.4
–0.5
–0.6
–0.8
–1.0
–40 C
0.01
0.1
1
10
100
0.01
0.1
1
10
100
CURRENT – A
TPC 1. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 1)
CURRENT – A
TPC 3. Error as a % of Reading over Temperature
with External Reference (PF = 1)
0.9
PF = 0.5
1.0
PF = 0.5
ON-CHIP REFERENCE
0.8 EXTERNAL REFERENCE
0.7
–40 C, PF = 0.5
0.6
0.5
0.4
+85 C, PF = 0. 5
0.3
+85 C, PF = 0.5
0.2
0
0.1
+25 C, PF = 1.0
–0.2
+25 C, PF = 1.0
+25 C, PF = 0.5
–0.1
–0.4
–0.3
–25 C, PF = 0.5
–0.6
–0.8
–40 C, PF = 0.5
–0.5
0.01
0.1
1
10
100
–1.0
0.01
0.1
1
10
100
CURRENT – A
TPC 2. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 0.5)
–6 –
CURRENT – A
TPC 4. Error as a % of Reading over Temperature
with External Reference (PF = 0.5)
REV. A
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